Trace Element Analysis Using a Benchtop Txrf-spectrometer
نویسنده
چکیده
Total Reflection X-Ray Fluorescence Analysis (TXRF) is an established technique for trace element analysis in various sample types. Restricted in the past to expensive large-scale systems, in this study the capability of a benchtop system for trace element analysis is reported. By analysing various heavy metals in raw and digested sewage as well as mercury in recycling glass, the suitability of the TXRF system for these kinds of applications could be proven. Based on this data, the benefits, disadvantages, and restrictions of the benchtop system in comparison to other trace element techniques like ICP-OES and AAS are evaluated.
منابع مشابه
Environmental trace-element analysis using a benchtop total reflection X-ray fluorescence spectrometer.
Total reflection X-ray fluorescence (TXRF) analysis is an established technique for trace-element analysis in various types of samples. Though expensive large-scale systems restricted the applications in the past, in this study the capability of a benchtop system for trace elemental analysis is reported. The suitability of this system for the mobile on-site analysis of heavy metal contaminated ...
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